Nano-electronics Systems & Materials Research Team
(NeoSMaRT)
2024
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators
3
Zanotti, Tommaso and Ranjan, Alok and O’Shea, Sean J. and Raghavan, Nagarajan and Thamankar, Ramesh and Leong Pey, Kin and Maria Puglisi, Francesco
IEEE Transactions on Device and Materials Reliability, 24, 2, 184-193 (2024)
IEEE
2023
A non-volatile resistive memory effect in 2, 2′, 6, 6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy
1
Courté, Marc; Surya, Sandeep G; Thamankar, Ramesh; Shen, Chao; Rao, V Ramgopal; Mhailsalkar, Subodh G; Fichou, Denis;
RSC Advances, 7, 6, 3336-3342 (2017)
Royal Society of Chemistry
Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations
2
R. Thamankar, F. M. Puglisi, A. Ranjan, N. Raghavan, K. Shubhakar, J. Molina, L. Larcher, A. Padovani, P. Pavan, S. J. O'Shea and K. L. Pey
Journal of Applied Physics, 112, 2, 24301 (2017)
American Institute of Physics
Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy
3
Thamankar, R; Raghavan, N; Molina, J; Puglisi, Francesco Maria; O'Shea, SJ; Shubhakar, K; Larcher, Luca; Pavan, Paolo; Padovani, Andrea; Pey, KL;
Journal of Applied Physics, 119, 8, 84304 (2016)
American Institute of Physics
Highly Luminescent Heterostructured Copper‐Doped Zinc Sulfide Nanocrystals for Application in Cancer Cell Labeling
5
Ang, Huixiang; Bosman, Michel; Thamankar, Ramesh; Zulkifli, Muhammad Faizal B; Yen, Swee Kuan; Hariharan, Anushya; Sudhaharan, Thankiah; Selvan, Subramanian Tamil;
ChemPhysChem, 17, 16, 2489-2495 (2016)
Chemistry Europe
An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO2/SiOx dielectric stacks for failure analysis
6
Shubhakar, Kalya; Bosman, Michel; Neucheva, OA; Loke, YC; Raghavan, Nagarajan; Thamankar, R; Ranjan, Alok; O'Shea, Sean J; Pey, Kin Leong;
Microelectronics Reliability, 55, 009-10, 1450-1455 (2015)
Pergamon